| A.1 Ö. Karcı, M. Dede , A.Oral, Design of a self-aligned, wide temperature range (300 mK-300 K) Atomic Force Microscope/Magnetic Force Microscope (AFM/MFM) with 10 nm MFM resolution. "Rev. Sci. Inst.", 85, (2014), p.103705.|
A.2 S. Sonusen, O. Karci, M. Dede, S. Aksoy, A. Oral, Single Layer Graphene Hall Sensors for Scanning Hall Probe Microscopy (SHPM) in 3−300 K Temperature Range. "App. Surf. Sci.", 308, (2014), p.414.
A.3 Ö.Karcı, J.O.Piatek,P.Jorba, M.Dede, H. M. Rønnow, A. Oral, An ultra-low temperature scanning Hall probe microscope (SHPM) for magnetic imaging below 40 mK. "Rev. Sci. Inst.", 85, (2014), p.103703.
A.4 S. Karamat, S. Sonuşen, Ü. Çelik, Y. Uysallı, E. Özgönül and A. Oral, Growth of few layer layer Single Crystal Graphene on Platinum using Chemical Vapour Deposition (CVD). "Progress in Natural Science: Materials International", 25, (2015), p.291-299.
A.5 S. Karamat, S. Sonuşen, Y. Uysallı, E. Özgönül, A. Oral, Coalescence of Few Layer Graphene Grains Grown by Chemical Vapour Deposition and their Stacking Sequence . "J. Mat. Res.", (2015).
A.6 S. Karamat, C. Ke, Ü. Inkaya, Rizwan Akram, Ilker Yildiz, S. Shah Zaman, A. Oral, Graphene/SrTiO3 heterointerface studied by X-ray photoelectron spectroscopy. "Progress in Natural Science: Materials International", 26, (2016), p.422-426.
A.7 S. Karamat, S. Sonuşen, Ümit Çelik, Y. Uysallı, A. Oral, Suitable alkaline for graphene peeling grown on metallic catalysts using chemical vapour deposition. "Appl. Surf. Sci.", 368, (2016).
A.8 M. Dede, R. Akram, A. Oral, 3D scanning Hall probe microscopy with 700 nm resolution. "Appl. Phys. Lett.", 109, (2016).
| A.1 M.Gurbuz,U.Celik,H. Sakurai, Y.Kuromitsu, A.Oral, A.Dogan, Structural and Electrical Characterization of Electro Spray Deposited PZT Sol-PZT Nanopowder Composite Thick Films. "2014 Joint IEEE International Symposium on the Applications of Ferroelectrics", 1, (2014), p.78.|
Book and Chapter in a Book
| A.1 M. M. Can, T. Fırat, S. I. Shah, F. Bakan ,A. Oral, The Effects of Post-Deposition Annealing Conditions on Structure and Created Defects in Zn0.90Co0.10O Thin Films Deposited on Si(100) Substrate. "", (2013), p.1557.|